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Search results for References by mukherjee, p.k.
Singh, R.R.; Goyal, S.P.; Mukherjee, P.K.; Saini, N.K.; Rathi, M.S., 2017. Application of X-Ray diffraction to characterize ivory, antler and rhino horn: implications for wildlife forensics. Forensic Science International 136 (Suppl. 1): 376-377

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